| Presentation | 2002/11/21 Fault Diagnosis for RAMs using Walsh Transform Atsumu ISENO, Yukihiro IGUCHI, Tsutomu SASAO, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, we show a method to locate single-stuck at fault for random access memory (RAM). From the fail-bitmaps of the memory, we obtain the Walsh transform of them. For single-stuck at faults, we show that the fault can be located by using only the 0-th and 1-st coefficients of the spectrum. The computation time is O(n×2^n), where n is the number of bits in the address. Thus, we can quickly locate the faults. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | memory test / Walsh transform / fault diagnosis / fail-bitmap / SRAM |
| Paper # | VLD2002-91 |
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| Conference Information | |
| Committee | VLD |
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| Conference Date | 2002/11/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | VLSI Design Technologies (VLD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fault Diagnosis for RAMs using Walsh Transform |
| Sub Title (in English) | |
| Keyword(1) | memory test |
| Keyword(2) | Walsh transform |
| Keyword(3) | fault diagnosis |
| Keyword(4) | fail-bitmap |
| Keyword(5) | SRAM |
| 1st Author's Name | Atsumu ISENO |
| 1st Author's Affiliation | Department of Computer Science, Meiji University() |
| 2nd Author's Name | Yukihiro IGUCHI |
| 2nd Author's Affiliation | Department of Computer Science, Meiji University |
| 3rd Author's Name | Tsutomu SASAO |
| 3rd Author's Affiliation | Department of Computer Science and Electronics, Kyushu Institute of Technology:Center for Microelectronic Systems, Kyushu Institute of Technology |
| Date | 2002/11/21 |
| Paper # | VLD2002-91 |
| Volume (vol) | vol.102 |
| Number (no) | 476 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |