| Presentation | 2002/11/21 Test Response Compression Using Huffman Coding Michihiro SHINTANI, Toshihiro OHARA, Hideyuki ICHIHARA, Tomoo INOUE, Akio TAMURA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Test compression / decompression is an efficient method for reducing the test application cost. In this paper we propose a response compression method using Huffman coding. The proposed method guarantees zero-aliasing because not only fault-free responses but also faulty responses are mapped into codewords. Moreover the method is independent of the fault model and the structure of a circuit-under-test, and uses only the knowledge of the fault free responses corresponding to a given test input set. Experimental results of compression ratio and the size of encoders by the proposed method are presented. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Huffman code / test compression / test response compression / test application time / ATE |
| Paper # | VLD2002-88 |
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| Conference Information | |
| Committee | VLD |
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| Conference Date | 2002/11/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | VLSI Design Technologies (VLD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Test Response Compression Using Huffman Coding |
| Sub Title (in English) | |
| Keyword(1) | Huffman code |
| Keyword(2) | test compression |
| Keyword(3) | test response compression |
| Keyword(4) | test application time |
| Keyword(5) | ATE |
| 1st Author's Name | Michihiro SHINTANI |
| 1st Author's Affiliation | Faculty of Information Sciences, Hiroshima City University() |
| 2nd Author's Name | Toshihiro OHARA |
| 2nd Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
| 3rd Author's Name | Hideyuki ICHIHARA |
| 3rd Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
| 4th Author's Name | Tomoo INOUE |
| 4th Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
| 5th Author's Name | Akio TAMURA |
| 5th Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
| Date | 2002/11/21 |
| Paper # | VLD2002-88 |
| Volume (vol) | vol.102 |
| Number (no) | 476 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |