Presentation 2002/6/21
Multi-Tone Curve Fitting Algorithms for ADC Testing
YOSHITO MOTOKI, Hidetake SUGAWARA, Haruo KOBAYASHI, Takanori KOMURO, Hiroshi SAKAYORI,
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Abstract(in English) This paper describes multi-tone curve fitting algorithms for ADC testing which are required for frequency domain applications such as communication application. We have developed two algorithms: (i) input frequency known case (coherent sampling test case), and (ii) input frequency unknown case (incoherent sampling test case). We have also performed numerical simulations to evaluate the algorithms, which showed that especially in input frequency unknown case, our algorithm can obtain more accurate curve fitting result compared to the one obtained by iteration usage of a conventional (single-tone) sine curve fitting algorithm.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) ADC / Sine Curve Fitting / LSI Testing / Intermodulation Distortion / Multi-tone Signal
Paper # VLD2002-44
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Committee VLD
Conference Date 2002/6/21(1days)
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Registration To VLSI Design Technologies (VLD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Multi-Tone Curve Fitting Algorithms for ADC Testing
Sub Title (in English)
Keyword(1) ADC
Keyword(2) Sine Curve Fitting
Keyword(3) LSI Testing
Keyword(4) Intermodulation Distortion
Keyword(5) Multi-tone Signal
1st Author's Name YOSHITO MOTOKI
1st Author's Affiliation Dept. of Electronic Engineering, Gunma University()
2nd Author's Name Hidetake SUGAWARA
2nd Author's Affiliation Dept. of Electronic Engineering, Gunma University
3rd Author's Name Haruo KOBAYASHI
3rd Author's Affiliation Dept. of Electronic Engineering, Gunma University
4th Author's Name Takanori KOMURO
4th Author's Affiliation Agilent Technologies Japan, Ltd.
5th Author's Name Hiroshi SAKAYORI
5th Author's Affiliation Agilent Technologies Japan, Ltd.
Date 2002/6/21
Paper # VLD2002-44
Volume (vol) vol.102
Number (no) 165
Page pp.pp.-
#Pages 6
Date of Issue