| Presentation | 2004/9/3 Dynamic Power-Supply and Well Noise Measurement and Analysis for High Frequency Body-Biased Circuits Kenji SHIMAZAKI, Makoto NAGATA, Takeshi OKUMOTO, Shozo HIRANO, Hiroyuki TSUJIKAWA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Dynamic noises on power-supply as well as multiple wells necessary for body-biased circuits show frequency components strongly characterized by the interaction of circuit operation and AC transfer of biasing networks. Measurements with the resolution of 100-ps and 100-uV for a few 100-ns and 1-V ranges on multiple points in a product register file are performed at various operating frequencies up to 400 MHz and show the noises clearly emphasized in frequency domain by the interaction. A proposed analysis flow recruiting a fast SPICE simulator and parasitic extractors can predict the dynamic noises due to combined power supply, ground, well, and substrate interactions, and provide robustness to the design of body-bias control circuitry. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Substrate noise / Power-supply noise / Ground Noise / Noise detector / Dynamic IR drop |
| Paper # | ICD2004-103 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2004/9/3(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Dynamic Power-Supply and Well Noise Measurement and Analysis for High Frequency Body-Biased Circuits |
| Sub Title (in English) | |
| Keyword(1) | Substrate noise |
| Keyword(2) | Power-supply noise |
| Keyword(3) | Ground Noise |
| Keyword(4) | Noise detector |
| Keyword(5) | Dynamic IR drop |
| 1st Author's Name | Kenji SHIMAZAKI |
| 1st Author's Affiliation | Semiconductor Company, Matsushita Electric Industrial Co., Ltd.() |
| 2nd Author's Name | Makoto NAGATA |
| 2nd Author's Affiliation | Department of Computer and Systems Engineering, Kobe University |
| 3rd Author's Name | Takeshi OKUMOTO |
| 3rd Author's Affiliation | Semiconductor Company, Matsushita Electric Industrial Co., Ltd. |
| 4th Author's Name | Shozo HIRANO |
| 4th Author's Affiliation | Semiconductor Company, Matsushita Electric Industrial Co., Ltd. |
| 5th Author's Name | Hiroyuki TSUJIKAWA |
| 5th Author's Affiliation | Semiconductor Company, Matsushita Electric Industrial Co., Ltd. |
| Date | 2004/9/3 |
| Paper # | ICD2004-103 |
| Volume (vol) | vol.104 |
| Number (no) | 288 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |