| Presentation | 2004/1/30 Relationships between LSI Power Supply Network and Switching Noise and Electromagnetic Radiation Toshio SUDO, Ken NAKANO, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Two types of test LSIs have been designed and fabricated in 0.25 um CMOS process. One was with on-chip decoupling capacitor, and the other was without on-chip capacitor. The effects of on-chip capacitor on simultaneous switching noise (SSN) and electromagnetic radiation were examined by using them experimentally. The fluctuation of power/ground line was greater, as the current drivability of output buffers was higher. The power line fluctuated in-phase to the ground line due to on-chip capacitor. While the power line fluctuated in opposite direction against the ground line at rising/falling edge of output signal for the chip without on-chip capacitor. Next, radiated emission was examined. Every harmonics was reduced for the core circuit operation due to on-chip capacitor, on the other hand, it has been found that only even harmonics were dramatically decreased for the output buffer circuit operation, and odd harmonics were not changed. This is because charge/discharge current of signal line did not affected so as to form signal-return path loop, and only short through current of output circuit was localized due to the existence of on-chip capacitor. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Electromagnetic Interference(EMI) / Power supply / Core circuit / I/O circuit / Chip scale package / On-chip decoupling capacitor / Simultaneous switching noise(SSN) / Radiated emission / Charge/discharge current / Short-through current |
| Paper # | CPM2003-187,ICD2003-226 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2004/1/30(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Relationships between LSI Power Supply Network and Switching Noise and Electromagnetic Radiation |
| Sub Title (in English) | |
| Keyword(1) | Electromagnetic Interference(EMI) |
| Keyword(2) | Power supply |
| Keyword(3) | Core circuit |
| Keyword(4) | I/O circuit |
| Keyword(5) | Chip scale package |
| Keyword(6) | On-chip decoupling capacitor |
| Keyword(7) | Simultaneous switching noise(SSN) |
| Keyword(8) | Radiated emission |
| Keyword(9) | Charge/discharge current |
| Keyword(10) | Short-through current |
| 1st Author's Name | Toshio SUDO |
| 1st Author's Affiliation | Association of Super-Advanced Electronics Technologies (ASET)() |
| 2nd Author's Name | Ken NAKANO |
| 2nd Author's Affiliation | Association of Super-Advanced Electronics Technologies (ASET) |
| Date | 2004/1/30 |
| Paper # | CPM2003-187,ICD2003-226 |
| Volume (vol) | vol.103 |
| Number (no) | 648 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |