| Presentation | 2003/11/21 A Method of Design for Delay Fault Testability of Controllers Tsuyoshi IWAGAKI, Satoshi OHTAKE, Hideo FUJIWARA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper proposes a non-scan testing scheme to enhance delay fault testability of controllers. In this scheme, the original behavior of a given controller is used in test application, and the faults that cannot be detected by the original behavior are tested by an extra logic called an invalid test state/transition generator (ISTG) . Our scheme allows the following: achieving (1) short test generation time, (2) short test application time and (3) at-speed testing. We experimentally show the effectiveness of our method. In our method, ISTGs can be designed flexibly in response to the test qualities demanded by circuit designers. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Controller / Delay fault / Design for testability / Invalid test state/transition generator / At-speed test / Non-scan design |
| Paper # | ICD2003-144 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2003/11/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Method of Design for Delay Fault Testability of Controllers |
| Sub Title (in English) | |
| Keyword(1) | Controller |
| Keyword(2) | Delay fault |
| Keyword(3) | Design for testability |
| Keyword(4) | Invalid test state/transition generator |
| Keyword(5) | At-speed test |
| Keyword(6) | Non-scan design |
| 1st Author's Name | Tsuyoshi IWAGAKI |
| 1st Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology() |
| 2nd Author's Name | Satoshi OHTAKE |
| 2nd Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology |
| 3rd Author's Name | Hideo FUJIWARA |
| 3rd Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology |
| Date | 2003/11/21 |
| Paper # | ICD2003-144 |
| Volume (vol) | vol.103 |
| Number (no) | 478 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |