Presentation 2003/8/14
Process dependence of 1/f noise : For realization of high performance analog circuits
TATSUYA OHGURO, YASUNORI OKAYAMA, KAZUYA MATSUZAWA, TAKESHI MATUNAGA, NOBUTOSHI AOKI, KENJI KOJIMA, HISAYO MOMOSE, KAZUNARI ISHIMARU,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In this paper, dependence of 1/f noise on oxynitridation process, sinter process and STI stress will be discussed.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) 1-f noise / Analog-digital converter / VCO / Phase noise
Paper # SDM2003-128,ICD2003-6
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Conference Date 2003/8/14(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Process dependence of 1/f noise : For realization of high performance analog circuits
Sub Title (in English)
Keyword(1) 1-f noise
Keyword(2) Analog-digital converter
Keyword(3) VCO
Keyword(4) Phase noise
1st Author's Name TATSUYA OHGURO
1st Author's Affiliation TOSHIBA Corporation Semiconductor Company()
2nd Author's Name YASUNORI OKAYAMA
2nd Author's Affiliation TOSHIBA Corporation Semiconductor Company
3rd Author's Name KAZUYA MATSUZAWA
3rd Author's Affiliation TOSHIBA Corporation Advanced LSI Technology Laboratory
4th Author's Name TAKESHI MATUNAGA
4th Author's Affiliation TOSHIBA Corporation Semiconductor Company
5th Author's Name NOBUTOSHI AOKI
5th Author's Affiliation TOSHIBA Corporation Semiconductor Company
6th Author's Name KENJI KOJIMA
6th Author's Affiliation TOSHIBA Corporation Semiconductor Company
7th Author's Name HISAYO MOMOSE
7th Author's Affiliation TOSHIBA Corporation Semiconductor Company
8th Author's Name KAZUNARI ISHIMARU
8th Author's Affiliation TOSHIBA Corporation Semiconductor Company
Date 2003/8/14
Paper # SDM2003-128,ICD2003-6
Volume (vol) vol.103
Number (no) 261
Page pp.pp.-
#Pages 6
Date of Issue