| Presentation | 2002/5/17 Gate Voltage Control Fluctuation in Single Electron Transistor : Operation Speed Improvements and Quantum Fluctuation Effects Tokio YUKIYA, Yuichiro HINO, Koji AIZAWA, Chugo FUJIHASHI, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A stochastic model to analyze dynamic characteristics of single electron transistor is presented and 2 level transient probabilities are derived. Transient characteristics and cut off properties at a steady state of the transistor are made clear from the model. Quantum fluctuation on charge control depending on an operation frequency is obtained from the relation of uncertainty principle between charge and flux quantities, and control limit caused by the fluctuation is discussed. For operation speed improvements, as the results, it is pointed out that the tunnel resistance reduction and the suppression of quantum noise effects by reducing the gate capacitance are important. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Single electron transistor / Dynamic characteristics / Stochastic process / Charge control quantum fluctuation |
| Paper # | ICD2002-34 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2002/5/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Gate Voltage Control Fluctuation in Single Electron Transistor : Operation Speed Improvements and Quantum Fluctuation Effects |
| Sub Title (in English) | |
| Keyword(1) | Single electron transistor |
| Keyword(2) | Dynamic characteristics |
| Keyword(3) | Stochastic process |
| Keyword(4) | Charge control quantum fluctuation |
| 1st Author's Name | Tokio YUKIYA |
| 1st Author's Affiliation | Faculty of Engineering, Tokyo Institute of Polytechnics() |
| 2nd Author's Name | Yuichiro HINO |
| 2nd Author's Affiliation | Faculty of Engineering, Tokyo Institute of Polytechnics |
| 3rd Author's Name | Koji AIZAWA |
| 3rd Author's Affiliation | Faculty of Engineering, Tokyo Institute of Polytechnics |
| 4th Author's Name | Chugo FUJIHASHI |
| 4th Author's Affiliation | Faculty of Engineering, Tokyo Institute of Polytechnics |
| Date | 2002/5/17 |
| Paper # | ICD2002-34 |
| Volume (vol) | vol.102 |
| Number (no) | 83 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |