| Presentation | 2002/5/17 A 100-GSa/s Sampling Oscilloscope Macro for Checking Signal Integrity in LSI Makoto TAKAMIYA, Masayuki MIZUNO, Kazuyuki NAKAMURA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | An on-chip 100-GHz-sampling-rate, 8-channel sampling oscilloscope for signal integrity checking has been developed with a 0.13-μm CMOS process. It contains a phase-interpolated sampling clock generator for 100GHz sampling rates, charge-sharing sampling heads for a wide -0.3V to Vdd+0.3V input range, and decoupling capacitors for noise-immune measurement. Supply noise and substrate noise are successfully measured by the macro. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Signal integrity / Supply noise / Sampling / Oscilloscope / Decoupling |
| Paper # | ICD2002-32 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2002/5/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A 100-GSa/s Sampling Oscilloscope Macro for Checking Signal Integrity in LSI |
| Sub Title (in English) | |
| Keyword(1) | Signal integrity |
| Keyword(2) | Supply noise |
| Keyword(3) | Sampling |
| Keyword(4) | Oscilloscope |
| Keyword(5) | Decoupling |
| 1st Author's Name | Makoto TAKAMIYA |
| 1st Author's Affiliation | Silicon Systems Research Labs, NEC Corporation() |
| 2nd Author's Name | Masayuki MIZUNO |
| 2nd Author's Affiliation | Silicon Systems Research Labs, NEC Corporation |
| 3rd Author's Name | Kazuyuki NAKAMURA |
| 3rd Author's Affiliation | Silicon Systems Research Labs, NEC Corporation:(Present address)Center for Microelectronic Systems, Kyushu Institute of Technology |
| Date | 2002/5/17 |
| Paper # | ICD2002-32 |
| Volume (vol) | vol.102 |
| Number (no) | 83 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |