Presentation 2003/2/27
HDL Design of ALU based on Constructive Timing Violation Technique and its Evaluation
Asami TANINO, Toshinori SATO, Itsujiro ARITA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) It is the situation that wire delay in circuit determines clock frequency of a chip rather than gate delay, with progress of semiconductor process technology. Moreover, freqency of microprocesser continues improving and it is becoming difficult to satisfy timing constraints. In recent years, microprocessers with high performance and low power is increasing importance. In this research, we design Carry Select Adder using Verilog-HDL, and investigate the distribution of timing failures depending on timing constraints, evaluating the usefulness of Constructive Timing Violation Technique.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Timing Constraints / Fault Tolerance / Carry Select Adder / Low Power Design
Paper # VLD2002-147,ICD2002-212
Date of Issue

Conference Information
Committee ICD
Conference Date 2003/2/27(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) HDL Design of ALU based on Constructive Timing Violation Technique and its Evaluation
Sub Title (in English)
Keyword(1) Timing Constraints
Keyword(2) Fault Tolerance
Keyword(3) Carry Select Adder
Keyword(4) Low Power Design
1st Author's Name Asami TANINO
1st Author's Affiliation KYUSYU INSTITUTE OF TECHNOLOGY()
2nd Author's Name Toshinori SATO
2nd Author's Affiliation KYUSYU INSTITUTE OF TECHNOLOGY
3rd Author's Name Itsujiro ARITA
3rd Author's Affiliation KYUSYU INSTITUTE OF TECHNOLOGY
Date 2003/2/27
Paper # VLD2002-147,ICD2002-212
Volume (vol) vol.102
Number (no) 685
Page pp.pp.-
#Pages 6
Date of Issue