Presentation	2003/1/24 Eigen-Signatures for Regularity-based I_ Testing Yukio OKUDA,
PDF Download Page	PDF download Page Link
Abstract(in Japanese)	(See Japanese page)
Abstract(in English)	We ha ve proposed I_ testing deep submicron(DSM) devices on exploiting the regularity of defect-free I_ signatures. This paper demonstrates : (1)A new methodology based on eigen-signatures ; (2)The fundamental characteristics of regularity ; (3) The I_ values related to a test vector set have a small variation, whereas, the I_ magnitudes have a large variation.
Keyword(in Japanese)	(See Japanese page)
Keyword(in English)	Intrinsic Leakage / Regularity / I_ Signature
Paper #	CPM2002-153,ICD2002-198
Date of Issue

Conference Information
Committee	ICD
Conference Date	2003/1/24(1days)
Place (in Japanese)	(See Japanese page)
Place (in English)
Topics (in Japanese)	(See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To	Integrated Circuits and Devices (ICD)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Eigen-Signatures for Regularity-based I_ Testing
Sub Title (in English)
Keyword(1)	Intrinsic Leakage
Keyword(2)	Regularity
Keyword(3)	I_ Signature
1st Author's Name	Yukio OKUDA
1st Author's Affiliation	Sony Corp. S&S Architecture Center()
Date	2003/1/24
Paper #	CPM2002-153,ICD2002-198
Volume (vol)	vol.102
Number (no)	623
Page	pp.pp.-
#Pages	6
Date of Issue