Presentation | 2003/1/23 Semiconductor device development using Data Mining Hidetaka Tsuda, Hidehiro Shirai, Osamu Takagi, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | It is important to utilize data for early development of semiconductor device and keep high yield. Data Mining is very useful to extract buried information and rules from enormous volume and many kinds of data. Many success stories have been reported in the marketing researches, POS data analysis. We have developed a method to be practical useful in development of LSl device and utilize them. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Yield / Device Development / Data Mining |
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Conference Information | |
Committee | ICD |
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Conference Date | 2003/1/23(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Semiconductor device development using Data Mining |
Sub Title (in English) | |
Keyword(1) | Yield |
Keyword(2) | Device Development |
Keyword(3) | Data Mining |
1st Author's Name | Hidetaka Tsuda |
1st Author's Affiliation | Manufacturing System Solution I, Fujitsu LSI Technology() |
2nd Author's Name | Hidehiro Shirai |
2nd Author's Affiliation | Manufacturing System Solution I, Fujitsu LSI Technology |
3rd Author's Name | Osamu Takagi |
3rd Author's Affiliation | Outsourcing Dept., Fujitsu |
Date | 2003/1/23 |
Paper # | |
Volume (vol) | vol.102 |
Number (no) | 622 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |