Presentation 2004/6/14
Growth and electrical properties of hafnium silicat films by vapor-liquid hybrid deposition : Growth of silicate films using TEOS precursor
Yi XUAN, Daisuke HOJO, Tetsuji YASUDA,
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Abstract(in English) We report electrical properties of hafnium silicate films prepared in an atomic layer deposition mode using Hf(O^tC_4H_9)_4 and Si(OC_2H_5)_4 precursors. Film deposition was carried out at room temperature using the vapor-liquid hybrid deposition technique. The C-V curves of the metal-oxide-semiconductor capacitor fabricated by postdeposition anneal and Au electrode evaporation shows good agreement with the theoretical one except for a positive flatband voltage shift. The leakage current density was four orders of magnitude lower than SiO_2 reference data.
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Keyword(in English) High-k / HfO_2 / silicate / TEOS / VALID / ALD
Paper # SDM2004-46
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Committee SDM
Conference Date 2004/6/14(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Growth and electrical properties of hafnium silicat films by vapor-liquid hybrid deposition : Growth of silicate films using TEOS precursor
Sub Title (in English)
Keyword(1) High-k
Keyword(2) HfO_2
Keyword(3) silicate
Keyword(4) TEOS
Keyword(5) VALID
Keyword(6) ALD
1st Author's Name Yi XUAN
1st Author's Affiliation MIRAI-ASRC, AIST()
2nd Author's Name Daisuke HOJO
2nd Author's Affiliation MIRAI-ASRC, AIST
3rd Author's Name Tetsuji YASUDA
3rd Author's Affiliation MIRAI-ASRC, AISt
Date 2004/6/14
Paper # SDM2004-46
Volume (vol) vol.104
Number (no) 134
Page pp.pp.-
#Pages 6
Date of Issue