Presentation 2004/1/23
Proposal and Experimental Demonstration of MRAM Cell Consisting of Magnetic Tunnel Junction and Negative Differential Resistance Device
Tetsuya UEMURA, Satoshi HONMA, Takao MARUKAME, Masafumi YAMAMOTO,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Two kinds of novel magnetic random access memory (MRAM) cells, which consist of a magnetic tunnel junction (MTJ) and a tunnel diode connected in parallel or in series, are proposed. Their basic operations were successfully confirmed by both simulation and experiment. The negative differential resistance (NDR) characteristics of the tunnel diode can increase the tunneling magnetoresistance (TMR) ratio of the MTJ. The fabricated circuit consisting of the CoFe based double junction MTJ and GaAs based tunnel diode showed that the effective MR ratio was enhanced from its original value of 15 to 890%. In the simulation, a sufficient operating margin of the bias current/voltage was obtained by using the MTJ with its original TMR ratio of more than 30%.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) MRAM / magnetic tunnel junction / negative differential resistance / tunneling magnetoresistance / tunnel diode
Paper # SDM2003-220
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Conference Information
Committee SDM
Conference Date 2004/1/23(1days)
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Paper Information
Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Proposal and Experimental Demonstration of MRAM Cell Consisting of Magnetic Tunnel Junction and Negative Differential Resistance Device
Sub Title (in English)
Keyword(1) MRAM
Keyword(2) magnetic tunnel junction
Keyword(3) negative differential resistance
Keyword(4) tunneling magnetoresistance
Keyword(5) tunnel diode
1st Author's Name Tetsuya UEMURA
1st Author's Affiliation Division of Electronics and Information Engineering, Hokkaido University()
2nd Author's Name Satoshi HONMA
2nd Author's Affiliation Division of Electronics and Information Engineering, Hokkaido University
3rd Author's Name Takao MARUKAME
3rd Author's Affiliation Division of Electronics and Information Engineering, Hokkaido University
4th Author's Name Masafumi YAMAMOTO
4th Author's Affiliation Division of Electronics and Information Engineering, Hokkaido University
Date 2004/1/23
Paper # SDM2003-220
Volume (vol) vol.103
Number (no) 631
Page pp.pp.-
#Pages 6
Date of Issue