| Presentation | 2004/1/22 Numerical Foundation of Hot-Electron Diffraction Experiment : Based on Ballistic Electron Emission Microscope Nobuya MACHIDA, Hiroyuki KANOH, Kazuhito FURUYA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We give numerical foundations for previously proposed experiment of hot-electron diffraction observation in solid based on Ballistic Electron Emission Microscope (BEEM). It is found that hot-electron wavefunction in semiconductor becomes quasi-spherical wave because of large refraction effect at base metal/semiconductor interface due to large differences of conduction band bottoms and effective masses between each materials. Thus, it has been made clear that the quantum reciprocity, our measurement principle, can be applied to our proposed experimental configuration by using BEEM. We have also carried out numerical simulations for our experiment with a π-phase shifter structure as a wavefront modulator by Finite Difference Time Domain (FDTD) method. The results showed diffraction patterns with high contrast and our scenario for hot-electron diffraction observation was ensured. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | hot electron / solid state / BEEM / reciprocity / interference / diffraction / wavefront / numerical simulation / FDTD |
| Paper # | SDM2003-208 |
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| Conference Information | |
| Committee | SDM |
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| Conference Date | 2004/1/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Silicon Device and Materials (SDM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Numerical Foundation of Hot-Electron Diffraction Experiment : Based on Ballistic Electron Emission Microscope |
| Sub Title (in English) | |
| Keyword(1) | hot electron |
| Keyword(2) | solid state |
| Keyword(3) | BEEM |
| Keyword(4) | reciprocity |
| Keyword(5) | interference |
| Keyword(6) | diffraction |
| Keyword(7) | wavefront |
| Keyword(8) | numerical simulation |
| Keyword(9) | FDTD |
| 1st Author's Name | Nobuya MACHIDA |
| 1st Author's Affiliation | Graduate School of Science and Engineering Tokyo Institute of Technology:CREST, Japan Science and technology Agency() |
| 2nd Author's Name | Hiroyuki KANOH |
| 2nd Author's Affiliation | Graduate School of Science and Engineering Tokyo Institute of Technology |
| 3rd Author's Name | Kazuhito FURUYA |
| 3rd Author's Affiliation | Graduate School of Science and Engineering Tokyo Institute of Technology:CREST, Japan Science and technology Agency |
| Date | 2004/1/22 |
| Paper # | SDM2003-208 |
| Volume (vol) | vol.103 |
| Number (no) | 630 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |