Presentation 2003/12/12
4H-SIC MOSFETs with a Novel Channel Structure (SC-MOSFET)
Junji Kaido, Tsunenobu Kimoto, Jun Suda, Hiroyuki Matsunami,
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Abstract(in English) 4H-S1C MOSFETs with a novel channel structure are presented. In the novel MOSFETs, a buried n-channel is sandwiched by a thin p-layer and p-body (SC-MOSFET). By the introduction of properly-designed p-layer beneath the gate oxide, more electrons can travel apart from the MOS interface, leading to higher channel mobility especially at high gate voltage. In this study, the effects of channel structure on the 4H-SiC (0001) MOSFET performance are investigated, and the characteristics of inversion-type MOSFET, buried channel MOSFET and SC-MOSFET were compared. The SC-MOSFET, processed by N_2O oxidation, with a 0.10μm-thick channel showed a high mobility of 40cm^2/Vs with a normally-off characteristic at a gate oxide field of 2.5MV/cm.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Silicon carbide / MOSFET / buried channel / channel mobility
Paper # SDM2003-190(2003-12)
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Conference Information
Committee SDM
Conference Date 2003/12/12(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) 4H-SIC MOSFETs with a Novel Channel Structure (SC-MOSFET)
Sub Title (in English)
Keyword(1) Silicon carbide
Keyword(2) MOSFET
Keyword(3) buried channel
Keyword(4) channel mobility
1st Author's Name Junji Kaido
1st Author's Affiliation Department of Electronic Science and Engineering, Kyoto University()
2nd Author's Name Tsunenobu Kimoto
2nd Author's Affiliation Department of Electronic Science and Engineering, Kyoto University
3rd Author's Name Jun Suda
3rd Author's Affiliation Department of Electronic Science and Engineering, Kyoto University
4th Author's Name Hiroyuki Matsunami
4th Author's Affiliation kaidouDepartment of Electronic Science and Engineering, Kyoto University
Date 2003/12/12
Paper # SDM2003-190(2003-12)
Volume (vol) vol.103
Number (no) 533
Page pp.pp.-
#Pages 6
Date of Issue