Presentation 2003/12/12
Crystal growth of polycrystalline Si prepared by combined method of SPC followed by ELA
N. Kawamoto, N. Matsuo, H. Hamada, Y. Harada,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The crystallinity of polycrystalline Si (poly-Si) produced by the combined method of solid phase crystallization (SPC) followed by excimer laser annealing (ELA) or ELA followed by SPC is examined. The tensile stress relaxation occurred by performing the SPC before or after ELA. Defect densities of poly-Si films which are recrystallized by ELA, ELA followed by SPC and SPC followed by ELA decrease in that order. By performing SPC at 590℃ for 350minutes followed by ELA, poly-Si film with low stress and low defect density was realized.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) polycrystalline Si / excimer laser annealing / solid phase crystallization / crystal growth mechanism
Paper # SDM2003-182(2003-12)
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Committee SDM
Conference Date 2003/12/12(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Crystal growth of polycrystalline Si prepared by combined method of SPC followed by ELA
Sub Title (in English)
Keyword(1) polycrystalline Si
Keyword(2) excimer laser annealing
Keyword(3) solid phase crystallization
Keyword(4) crystal growth mechanism
1st Author's Name N. Kawamoto
1st Author's Affiliation Department of Electrical and Electronic Engineering, Yamaguchi University()
2nd Author's Name N. Matsuo
2nd Author's Affiliation Department of Material Engineering, Himeji Institute of Technology
3rd Author's Name H. Hamada
3rd Author's Affiliation Materials and Devices Development Center BU, SANYO Electric Co., Ltd.
4th Author's Name Y. Harada
4th Author's Affiliation Department of Material Engineering, Himeji Institute of Technology
Date 2003/12/12
Paper # SDM2003-182(2003-12)
Volume (vol) vol.103
Number (no) 533
Page pp.pp.-
#Pages 5
Date of Issue