Presentation 2003/12/12
[Invited Paper] Low Temperature Gate Dielectrics for Organic Thin-Film Transistors on Plastic Substrates
Prakaipetch Punchaipetch, Gaurang Pant, Robert M. Wallace, Bruce E. Gnade,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The physical and electrical properties of hafnium silicate (HfSi_xO) films produced by low temperature processing conditions (〓150°C) suitable for flexible display applications were studied using sputter deposition and ultraviolet generated ozone treatments. Films with no detectable low-κ interfacial layer were produced. Rutherford Backscattering Spectroscopy (RBS), X-ray Photoelectron Spectroscopy (XPS), and High Resolution Transmission Electron Microscopy (HR-TEM) were used to determine the composition, chemical bonding environment, thickness, and film interface. The electrical behavior of the as-deposited and annealed silicate films were determined by current-voltage (I-V) and capacitance-voltage (C-V) easurements. The electrical performance of the Organic Thin Film Transistors (OTFTs) prepared by the low temperature processing HfSi_xO_y gate oxide will also be reported.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) High-κ gate dielectrics / hafnium silicate / stacked structure gate oxide / organic thin film transistors
Paper # SDM2003-179(2003-12)
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Committee SDM
Conference Date 2003/12/12(1days)
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Registration To Silicon Device and Materials (SDM)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Paper] Low Temperature Gate Dielectrics for Organic Thin-Film Transistors on Plastic Substrates
Sub Title (in English)
Keyword(1) High-κ gate dielectrics
Keyword(2) hafnium silicate
Keyword(3) stacked structure gate oxide
Keyword(4) organic thin film transistors
1st Author's Name Prakaipetch Punchaipetch
1st Author's Affiliation Department of Materials Science, University of North Texas Denton()
2nd Author's Name Gaurang Pant
2nd Author's Affiliation Department of Materials Science, University of North Texas Denton
3rd Author's Name Robert M. Wallace
3rd Author's Affiliation Department of Materials Science, University of North Texas Denton
4th Author's Name Bruce E. Gnade
4th Author's Affiliation Department of Materials Science, University of North Texas Denton
Date 2003/12/12
Paper # SDM2003-179(2003-12)
Volume (vol) vol.103
Number (no) 533
Page pp.pp.-
#Pages 6
Date of Issue