Presentation | 2003/9/22 Analysis of Quantum Effects by Full Band Monte Carlo Simulator FALCON Ryo Tanabe, Yoshio Ashizawa, Hideki Oka, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In sub-100 nm regime ultrasmall MOSFET, it is difficult to describe carrier transport phenomena by conventional drift-diffusion model, and a Monte Carlo method becomes very important. We implemented a quantum effect model in Fujitsu 2D Full Band Ensemble Monte Carlo Simulator FALCON and evaluated influence affected by quantum effects. And recently, Non-Planar devices such as FinFET and TriGate FET are often studied. In such devices, structural and quantum 3D effects are very important. Then we simulated 3D structure devices including 3D Density Gradient quantum effect with ISE 3D device simulator DESSIS, and studied the limit of 2D Monte Carlo analysis. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Full Band / Monte Carlo / FALCON / Quantum Effect / FinFET / Density Gradient / Bohm-based / 3D |
Paper # | VLD2003-58 |
Date of Issue |
Conference Information | |
Committee | SDM |
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Conference Date | 2003/9/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Silicon Device and Materials (SDM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Analysis of Quantum Effects by Full Band Monte Carlo Simulator FALCON |
Sub Title (in English) | |
Keyword(1) | Full Band |
Keyword(2) | Monte Carlo |
Keyword(3) | FALCON |
Keyword(4) | Quantum Effect |
Keyword(5) | FinFET |
Keyword(6) | Density Gradient |
Keyword(7) | Bohm-based |
Keyword(8) | 3D |
1st Author's Name | Ryo Tanabe |
1st Author's Affiliation | Fujitsu Laboratories Ltd.() |
2nd Author's Name | Yoshio Ashizawa |
2nd Author's Affiliation | Fujitsu Laboratories Ltd. |
3rd Author's Name | Hideki Oka |
3rd Author's Affiliation | Fujitsu Laboratories Ltd. |
Date | 2003/9/22 |
Paper # | VLD2003-58 |
Volume (vol) | vol.103 |
Number (no) | 338 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |