Presentation 2003/2/14
Optimal Testing Policy for a System with Self-Testing
Satoshi MIZUTANI, Toshio NAKAGAWA, Kodo ITO,
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Abstract(in English) Suppose that a system has the property of selftesting : If there exist valid input codes such that some faults can be detected by checking the oputput codes, then it is called that the system has the property of self-testing. However, if the self-testing is imperfect then some faults can not be instantly detected. Therefore, it would be necessary to execute scheduled tests for instantly detection of fault. This paper considers the scheduled testing policy for the system. Then, introducing the loss cost elapsed between fault and its detection, the total expected cost until the detection of falut is obtained. Optimal interval scheduled tests which minimizes the total expected cost are derived.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Self-testing / Expected cost / Optimal policy / Self-detection rate
Paper # R2002-69,EMD2002-102
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Conference Date 2003/2/14(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Optimal Testing Policy for a System with Self-Testing
Sub Title (in English)
Keyword(1) Self-testing
Keyword(2) Expected cost
Keyword(3) Optimal policy
Keyword(4) Self-detection rate
1st Author's Name Satoshi MIZUTANI
1st Author's Affiliation Department of Industrial Engineering, Aichi Institute of Technology()
2nd Author's Name Toshio NAKAGAWA
2nd Author's Affiliation Department of Industrial Engineering, Aichi Institute of Technology
3rd Author's Name Kodo ITO
3rd Author's Affiliation Nagoya Guidance & Propulsion Systems Works, Mitsubishi Heavy Industries, LTD.
Date 2003/2/14
Paper # R2002-69,EMD2002-102
Volume (vol) vol.102
Number (no) 653
Page pp.pp.-
#Pages 4
Date of Issue