Presentation | 2002/11/8 A Sulfuration Gas Test for Chip Components With Solder Plating on Silver Termination Toru YASUI, Sadanori ITO, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | It examined about failure phenomena of the chip components, used for electric components occurred by the sulfuration gas atmosphere. The chip components of test targets have the termination(inner) of silver. As the result, on the chip resistor arrays and the chip resistors, it found that sulfuration silver creap and sulfuration silver whisker expanded between the exterior and the termination(outer). Their phenomena cause short mode by ion migration and open mode by silver exhaustion. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | sulfuration silver creap / sulfuration silver whisker / ion migration / chip resistor arrays / chip resistors |
Paper # | R2002-32 |
Date of Issue |
Conference Information | |
Committee | R |
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Conference Date | 2002/11/8(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Reliability(R) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Sulfuration Gas Test for Chip Components With Solder Plating on Silver Termination |
Sub Title (in English) | |
Keyword(1) | sulfuration silver creap |
Keyword(2) | sulfuration silver whisker |
Keyword(3) | ion migration |
Keyword(4) | chip resistor arrays |
Keyword(5) | chip resistors |
1st Author's Name | Toru YASUI |
1st Author's Affiliation | OMRON Corporation Centralized Purchasing Department() |
2nd Author's Name | Sadanori ITO |
2nd Author's Affiliation | OMRON Corporation Centralized Purchasing Department |
Date | 2002/11/8 |
Paper # | R2002-32 |
Volume (vol) | vol.102 |
Number (no) | 454 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |