| Presentation | 2002/11/21 Test data volume reduction using statistical encoding for multiple scan chain designs Kenjiro Taniguchi, Kohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper we propose a new method of test data compression for multiple scan chain designs. The proposed method consists of two phases of data compression. In the first phase, ATPG test vectors applied to multiple scan chains are encoded to reduce the number of test input pins and thus reduce the test data volume. In the second phase, the encoded test vectors are compressed further using statistical encoding to reduce the length of the test sequences applied to each test pin. This reduces test loading time and test data volume. Experimental results for large ISCAS-89 benchmark circuits show that the proposed method reduced the test data volume to 21.5% on average. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | test data compression / don't-care identification / multiple scan chain designs / Huffman's encoding / SoC testing |
| Paper # | CPSY2002-65 |
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| Conference Information | |
| Committee | CPSY |
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| Conference Date | 2002/11/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Computer Systems (CPSY) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Test data volume reduction using statistical encoding for multiple scan chain designs |
| Sub Title (in English) | |
| Keyword(1) | test data compression |
| Keyword(2) | don't-care identification |
| Keyword(3) | multiple scan chain designs |
| Keyword(4) | Huffman's encoding |
| Keyword(5) | SoC testing |
| 1st Author's Name | Kenjiro Taniguchi |
| 1st Author's Affiliation | Department of Computer Sciences and Electronics, Kyushu Institute of Technology() |
| 2nd Author's Name | Kohei Miyase |
| 2nd Author's Affiliation | Department of Computer Sciences and Electronics, Kyushu Institute of Technology |
| 3rd Author's Name | Seiji Kajihara |
| 3rd Author's Affiliation | Department of Computer Sciences and Electronics, Kyushu Institute of Technology:Center for Microelectronics Systems, Kyushu Institute of Technology |
| 4th Author's Name | Irith Pomeranz |
| 4th Author's Affiliation | School of Electrical and Computer Engineering, Purdue University |
| 5th Author's Name | Sudhakar M. Reddy |
| 5th Author's Affiliation | Electrical and Computer Engineering Department, University of Iowa |
| Date | 2002/11/21 |
| Paper # | CPSY2002-65 |
| Volume (vol) | vol.102 |
| Number (no) | 478 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |