Presentation | 2004/6/24 A Study on Measurement Methods for Reflectivity of Electromagnetic Absorbers in Millimeter-waves (Part 2) : Standardization of Free Space Method by using Horn Antennas with Dielectric Lens Yoshihiko TODAKA, Yutaka HIGASHIDA, Atsuhiro NISHIKATA, Takashi TAKAHASHI, Osamu HASHIMOTO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A free space method is in wide spread use for the reflectivity measurement of electromagnetic wave absorbers, abbreviated as EMA, in VHF and UHF band. In a free space method, both the reflection levels from EMA and the metal plate of the same size are measured and the reflectivity is calculated by their ratio. The incident angle, such as normal, or oblique, must be specified, and the polarization of electromagnetic wave must also be specified as TE, TM, or circularly-polarized mode. The working group of Japanese IEC/SC46F sub-technical committee is now working for constructing a standard of the Three methods, the one using the horn antennas and the others using antennas with dielectric lenses in order to measure the reflectivity of EMA in millimeter wave frequency range. In this paper, the method using the horn antennas with beam focusing dielectric lens is studied experimentally. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Millimeter Wave / Free Space Method / Electromagnetic Absorber / Dielectric lens / Reflectivity / SC46F |
Paper # | EMCJ2004-32 |
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Conference Information | |
Committee | EMCJ |
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Conference Date | 2004/6/24(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Study on Measurement Methods for Reflectivity of Electromagnetic Absorbers in Millimeter-waves (Part 2) : Standardization of Free Space Method by using Horn Antennas with Dielectric Lens |
Sub Title (in English) | |
Keyword(1) | Millimeter Wave |
Keyword(2) | Free Space Method |
Keyword(3) | Electromagnetic Absorber |
Keyword(4) | Dielectric lens |
Keyword(5) | Reflectivity |
Keyword(6) | SC46F |
1st Author's Name | Yoshihiko TODAKA |
1st Author's Affiliation | EPSG, Agilent Technologies() |
2nd Author's Name | Yutaka HIGASHIDA |
2nd Author's Affiliation | Materials R&D, Japan Fine Ceramics Center |
3rd Author's Name | Atsuhiro NISHIKATA |
3rd Author's Affiliation | CRADLE, Tokyo Institute of Technology |
4th Author's Name | Takashi TAKAHASHI |
4th Author's Affiliation | Japan Fine Ceramics Association |
5th Author's Name | Osamu HASHIMOTO |
5th Author's Affiliation | Aoyama-Gakuin University |
Date | 2004/6/24 |
Paper # | EMCJ2004-32 |
Volume (vol) | vol.104 |
Number (no) | 151 |
Page | pp.pp.- |
#Pages | 8 |
Date of Issue |