Presentation 2004/6/24
A Study on Measurement Methods for Reflectivity of Electromagnetic Absorbers in Millimeter-waves (Part 2) : Standardization of Free Space Method by using Horn Antennas with Dielectric Lens
Yoshihiko TODAKA, Yutaka HIGASHIDA, Atsuhiro NISHIKATA, Takashi TAKAHASHI, Osamu HASHIMOTO,
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Abstract(in English) A free space method is in wide spread use for the reflectivity measurement of electromagnetic wave absorbers, abbreviated as EMA, in VHF and UHF band. In a free space method, both the reflection levels from EMA and the metal plate of the same size are measured and the reflectivity is calculated by their ratio. The incident angle, such as normal, or oblique, must be specified, and the polarization of electromagnetic wave must also be specified as TE, TM, or circularly-polarized mode. The working group of Japanese IEC/SC46F sub-technical committee is now working for constructing a standard of the Three methods, the one using the horn antennas and the others using antennas with dielectric lenses in order to measure the reflectivity of EMA in millimeter wave frequency range. In this paper, the method using the horn antennas with beam focusing dielectric lens is studied experimentally.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Millimeter Wave / Free Space Method / Electromagnetic Absorber / Dielectric lens / Reflectivity / SC46F
Paper # EMCJ2004-32
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Committee EMCJ
Conference Date 2004/6/24(1days)
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Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study on Measurement Methods for Reflectivity of Electromagnetic Absorbers in Millimeter-waves (Part 2) : Standardization of Free Space Method by using Horn Antennas with Dielectric Lens
Sub Title (in English)
Keyword(1) Millimeter Wave
Keyword(2) Free Space Method
Keyword(3) Electromagnetic Absorber
Keyword(4) Dielectric lens
Keyword(5) Reflectivity
Keyword(6) SC46F
1st Author's Name Yoshihiko TODAKA
1st Author's Affiliation EPSG, Agilent Technologies()
2nd Author's Name Yutaka HIGASHIDA
2nd Author's Affiliation Materials R&D, Japan Fine Ceramics Center
3rd Author's Name Atsuhiro NISHIKATA
3rd Author's Affiliation CRADLE, Tokyo Institute of Technology
4th Author's Name Takashi TAKAHASHI
4th Author's Affiliation Japan Fine Ceramics Association
5th Author's Name Osamu HASHIMOTO
5th Author's Affiliation Aoyama-Gakuin University
Date 2004/6/24
Paper # EMCJ2004-32
Volume (vol) vol.104
Number (no) 151
Page pp.pp.-
#Pages 8
Date of Issue