Presentation 2004/6/23
Non-invasive Near Field Measurement Using Modulated Scattering Element
Jerdvisanop CHAKAROTHAI, Qiang CHEN, Kunio SAWAYA,
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Abstract(in English) As operating frequency increases, the problem that undesired noise is radiated from electronic devices becomes more and more serious. To solve this problem, it is necessary to measure the electromagnetic field near the devices accurately to detect the source location of the electromagnetic radiation. However, usually the probe and its cable disturb the original field distribution and degrade the accuracy of the near field measurement. In this report, a non-invasive near-field measurement method using a modulated scattering element as the probe which is wireless and electrically small is proposed and validity of the method is demonstrated by the experiment.
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Keyword(in English) Near-field Measurement / Non-invasive / Modulated Scattering Element / Antenna / Probe
Paper # EMCJ2004-16
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Committee EMCJ
Conference Date 2004/6/23(1days)
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Registration To Electromagnetic Compatibility (EMCJ)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Non-invasive Near Field Measurement Using Modulated Scattering Element
Sub Title (in English)
Keyword(1) Near-field Measurement
Keyword(2) Non-invasive
Keyword(3) Modulated Scattering Element
Keyword(4) Antenna
Keyword(5) Probe
1st Author's Name Jerdvisanop CHAKAROTHAI
1st Author's Affiliation Electrical and Communication Engineering, Graduate School of Engineering, Tohoku University()
2nd Author's Name Qiang CHEN
2nd Author's Affiliation Electrical and Communication Engineering, Graduate School of Engineering, Tohoku University
3rd Author's Name Kunio SAWAYA
3rd Author's Affiliation Electrical and Communication Engineering, Graduate School of Engineering, Tohoku University
Date 2004/6/23
Paper # EMCJ2004-16
Volume (vol) vol.104
Number (no) 150
Page pp.pp.-
#Pages 4
Date of Issue