| Presentation | 2003/11/28 Validity of FDTD Simulation on a Transient Analysis of Electromagnetic Field Inside the Metal Package Takayuki YAMAMOTO, Atsuhiro NISHIKATA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | As one of the electromagnetic interference problem in a metal package, we study the validity of FDTD calculation by simulating the pulse excitation of microstrip lines surrounded by perfect electric conductor walls. Especially, the comparison with measurement, as well as the comparison between different simulation conditions, are performed, and the preservation of electric power is checked. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Metal package / FDTD method / EMI problem / microstrip lines |
| Paper # | EMCJ2003-120 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2003/11/28(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Validity of FDTD Simulation on a Transient Analysis of Electromagnetic Field Inside the Metal Package |
| Sub Title (in English) | |
| Keyword(1) | Metal package |
| Keyword(2) | FDTD method |
| Keyword(3) | EMI problem |
| Keyword(4) | microstrip lines |
| 1st Author's Name | Takayuki YAMAMOTO |
| 1st Author's Affiliation | Tokyo Institute of Technology() |
| 2nd Author's Name | Atsuhiro NISHIKATA |
| 2nd Author's Affiliation | Tokyo Institute of Technology |
| Date | 2003/11/28 |
| Paper # | EMCJ2003-120 |
| Volume (vol) | vol.103 |
| Number (no) | 488 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |