Presentation 2003/10/14
Optically Scanning Electric Field Probe System
Eiji SUZUKI, Satoru ARAKAWA, Hiroyasu OTA, Kenichi ARAI,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We have developed an optically scanning electromagnetic field probe designed to realize high-speed measurement of electromagnetic field distribution near PCB boards or LSI chips with high spatial resolution up to the gigahertz range. The probe uses an electro-optic crystal and a scanned laser beam for high-speed measurement. We examined the probe characteristics of frequency response, linearity, and spatial resolution for electric field detection up to 10 GHz.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Probe / Optical Sensor / Electro-Optic Effect / Galvano Scanner / Electromagnetic Near-Field
Paper # EMCJ2003-88,MW2003-185
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Committee EMCJ
Conference Date 2003/10/14(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Optically Scanning Electric Field Probe System
Sub Title (in English)
Keyword(1) Probe
Keyword(2) Optical Sensor
Keyword(3) Electro-Optic Effect
Keyword(4) Galvano Scanner
Keyword(5) Electromagnetic Near-Field
1st Author's Name Eiji SUZUKI
1st Author's Affiliation Sendai EMC Research Center TELECOMMUNlCATIONS ADVANCEMENT ORGANIZATION OF JAPAN()
2nd Author's Name Satoru ARAKAWA
2nd Author's Affiliation Sendai EMC Research Center TELECOMMUNlCATIONS ADVANCEMENT ORGANIZATION OF JAPAN
3rd Author's Name Hiroyasu OTA
3rd Author's Affiliation Sendai EMC Research Center TELECOMMUNlCATIONS ADVANCEMENT ORGANIZATION OF JAPAN
4th Author's Name Kenichi ARAI
4th Author's Affiliation Sendai EMC Research Center TELECOMMUNlCATIONS ADVANCEMENT ORGANIZATION OF JAPAN:Research Institute of Electrical Communication, Tohoku University
Date 2003/10/14
Paper # EMCJ2003-88,MW2003-185
Volume (vol) vol.103
Number (no) 370
Page pp.pp.-
#Pages 5
Date of Issue