Presentation | 2003/9/5 A Study on the Disturbance Evaluations related to the Performance of Digital Communication Systems (Part 1) Kaoru GOTOH, Yukio YAMANAKA, Takashi SHINOZUKA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | π/4 shift QPSK base-band computer simulations were made for the comparisons between two methods, APD and RMS-AVE detector as the disturbance measuring receiver to evaluate the degradation of the digital communication systems above 1GHz.Disturbance noise was composed by repetition pulse noise and the additive Gaussian noise at the simulation. The certain validity of these detectors could be presented by taking the correlations between BER and each method's outputs, and it is found the APD is highly sensitive to the variation of BER and gives us the useful information about the interference noise compared to the RMS-AVE detector. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | disturbance measuring receiver / APD detector / RMS-AVE detector / BER |
Paper # | EMCJ2003-66 |
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Conference Information | |
Committee | EMCJ |
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Conference Date | 2003/9/5(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Electromagnetic Compatibility (EMCJ) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Study on the Disturbance Evaluations related to the Performance of Digital Communication Systems (Part 1) |
Sub Title (in English) | |
Keyword(1) | disturbance measuring receiver |
Keyword(2) | APD detector |
Keyword(3) | RMS-AVE detector |
Keyword(4) | BER |
1st Author's Name | Kaoru GOTOH |
1st Author's Affiliation | Communications Research Laboratory() |
2nd Author's Name | Yukio YAMANAKA |
2nd Author's Affiliation | Communications Research Laboratory |
3rd Author's Name | Takashi SHINOZUKA |
3rd Author's Affiliation | Communications Research Laboratory |
Date | 2003/9/5 |
Paper # | EMCJ2003-66 |
Volume (vol) | vol.103 |
Number (no) | 302 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |