| Presentation | 2002/10/31 Micromagnetic Modeling of High Density Recording with Double Layered Perpendicular Media and Single Pole Head S. C. Lee, Y W. Tahk, K. J. Lee, T. D. Lee, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this work, micromagnetic simulations of writing and reading processes in a perpendicular system including a single pole head and a recording medium with soft underlayer (SUL) have been performed. The noise contribution from the recording layer increased with increasing grain size distribution of the recording layer but that from soft underlayer remained almost a constant at a given linear density. Details of the noise from the soft underlayer will be discussed. Also thermal decay over a long time scale of the recorded bits was investigated by the Langevin equation and the time-temperature scaling method. It was found that at the linear density of 1058 kfci, narrower grain size distribution in the recording layer is very important in the point of thermal decay than expectation. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | micromagnetics / perpendicular double layer / noise / grain size distribution / thermal decay |
| Paper # | MR 2002-45 |
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| Conference Information | |
| Committee | MR |
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| Conference Date | 2002/10/31(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Magnetic Recording (MR) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Micromagnetic Modeling of High Density Recording with Double Layered Perpendicular Media and Single Pole Head |
| Sub Title (in English) | |
| Keyword(1) | micromagnetics |
| Keyword(2) | perpendicular double layer |
| Keyword(3) | noise |
| Keyword(4) | grain size distribution |
| Keyword(5) | thermal decay |
| 1st Author's Name | S. C. Lee |
| 1st Author's Affiliation | Dept. of Materials Science and Engineering:Storage Lab. Samsung Advanced Institute of Technology() |
| 2nd Author's Name | Y W. Tahk |
| 2nd Author's Affiliation | Dept. of Materials Science and Engineering:Storage Lab. Samsung Advanced Institute of Technology |
| 3rd Author's Name | K. J. Lee |
| 3rd Author's Affiliation | Dept. of Materials Science and Engineering:Storage Lab. Samsung Advanced Institute of Technology |
| 4th Author's Name | T. D. Lee |
| 4th Author's Affiliation | Dept. of Materials Science and Engineering:Storage Lab. Samsung Advanced Institute of Technology |
| Date | 2002/10/31 |
| Paper # | MR 2002-45 |
| Volume (vol) | vol.102 |
| Number (no) | 423 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |