Presentation 2002/10/31
Studies on Sputtered NdFeB Thin Films for Perpendicular Magnetic Recording
Y.G. Mat, Z. Yang, F.L. Wei, M. Matsumoto, A. Morisako, S. Takei,
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Abstract(in English) The effects of magnetic layer thickness and boron addition on the microstructure and magnetic properties of NdFeB thin films sputtered onto W underlayer have been investigated. The films could maintain prominent perpendicular magnetic anisotropy when their thickness values were smaller than 30 nm. Beyond this value, the c-axis orientations of magnetic grains became irregular gradually. Moderate boron addition could effectively suppress grains growth and narrow grain size distributions as well as tailor the high coercivity force to an applicable value while keeping a relative high remanent ratio. The grains also became more isolated.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) underlayer / uniaxial anisotropy / grain size distribution / perpendicular recording
Paper # MR 2002-40
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Committee MR
Conference Date 2002/10/31(1days)
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Registration To Magnetic Recording (MR)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Studies on Sputtered NdFeB Thin Films for Perpendicular Magnetic Recording
Sub Title (in English)
Keyword(1) underlayer
Keyword(2) uniaxial anisotropy
Keyword(3) grain size distribution
Keyword(4) perpendicular recording
1st Author's Name Y.G. Mat
1st Author's Affiliation the Research Institute of Magnetic Materials, Lanzhou University()
2nd Author's Name Z. Yang
2nd Author's Affiliation the Research Institute of Magnetic Materials, Lanzhou University
3rd Author's Name F.L. Wei
3rd Author's Affiliation the Research Institute of Magnetic Materials, Lanzhou University
4th Author's Name M. Matsumoto
4th Author's Affiliation Department of Information Engineering, Shinshu University
5th Author's Name A. Morisako
5th Author's Affiliation Department of Information Engineering, Shinshu University
6th Author's Name S. Takei
6th Author's Affiliation Department of Information Engineering, Shinshu University
Date 2002/10/31
Paper # MR 2002-40
Volume (vol) vol.102
Number (no) 423
Page pp.pp.-
#Pages 4
Date of Issue