Presentation 2002/9/26
Evaluation of High Frequency Properties of RW-Wires Used for HDD HEads
Masahiro YAMAGUCHI, Chikao TESHIROGI, Kazuya YOSHIDA, Takashi KURIBARA, Shin YABUKAMI, Shinki KIKUSHI, Kenichi ARAI,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Beginning from the study of reproducibility of electric contact between the wafer probe and the RW wire,equivalent circuit parameters of RW-wires were extracted as ; Low frequency inductance of a pair of W-or R-wire was 30nH,which means each wire has inductance of 15nH or less.Low frequency resistance was 5Ω, showing the resistance of each wire as 2.5Ω.Stray capacitance were 2-3 pF at low frequency was 2GHz.Cross-talk model is also discussed.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) RW-wire / High Frequency / S Parameter / Parasitic Impedance / Ceoss Talk
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Conference Date 2002/9/26(1days)
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Language JPN
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Title (in English) Evaluation of High Frequency Properties of RW-Wires Used for HDD HEads
Sub Title (in English)
Keyword(1) RW-wire
Keyword(2) High Frequency
Keyword(3) S Parameter
Keyword(4) Parasitic Impedance
Keyword(5) Ceoss Talk
1st Author's Name Masahiro YAMAGUCHI
1st Author's Affiliation Research Institute of Electrical Communication,Tohoku University()
2nd Author's Name Chikao TESHIROGI
2nd Author's Affiliation Faculty of Engineeing,Tohoku Gakuin University
3rd Author's Name Kazuya YOSHIDA
3rd Author's Affiliation Faculty of Engineeing,Tohoku Gakuin University
4th Author's Name Takashi KURIBARA
4th Author's Affiliation Research Institute of Electrical Communication,Tohoku University
5th Author's Name Shin YABUKAMI
5th Author's Affiliation Research Institute of Electrical Communication,Tohoku University
6th Author's Name Shinki KIKUSHI
6th Author's Affiliation Faculty of Engineeing,Tohoku Gakuin University
7th Author's Name Kenichi ARAI
7th Author's Affiliation Research Institute of Electrical Communication,Tohoku University
Date 2002/9/26
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Volume (vol) vol.102
Number (no) 355
Page pp.pp.-
#Pages 4
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