Presentation 2004/1/6
PLANAR SURFACE DETECTION BASED ON THE FACTORIZATION METHOD (Computer Graphics/Vision I)(International Workshop On Advanced Image Technology (IWAIT2004))
Hiroki MANO, Akihiro MINAGAWA, Norio TAGAWA,
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Abstract(in English) We present herein a new method for detecting the directions of planar surfaces, which is based on the factorization method, a method that is frequently used as in shape reconstruction and involves feature points correspondence between several images. When the surface around each feature point consists of a planar surface, coordinate transformation by affine transformation is possible. Since moments are closed to affine transformations, parameters for affine transformation can be calculated from moments based on the linear representation of the group of an affine transformation. In the present method, the rank on singular value decomposition (SVD) is three. This formulation has no space for extension, and the rank is maintained identical to that of the original factorization method.
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Paper # IE2003-178
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Conference Date 2004/1/6(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
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Title (in English) PLANAR SURFACE DETECTION BASED ON THE FACTORIZATION METHOD (Computer Graphics/Vision I)(International Workshop On Advanced Image Technology (IWAIT2004))
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1st Author's Name Hiroki MANO
1st Author's Affiliation Graduate School of Engineering, Tokyo Metropolitan University()
2nd Author's Name Akihiro MINAGAWA
2nd Author's Affiliation Graduate School of Engineering, Tokyo Metropolitan University
3rd Author's Name Norio TAGAWA
3rd Author's Affiliation Graduate School of Engineering, Tokyo Metropolitan University
Date 2004/1/6
Paper # IE2003-178
Volume (vol) vol.103
Number (no) 540
Page pp.pp.-
#Pages 5
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