Presentation 2003/12/5
Hafnium Carbide Coated Poly-crystalline Silicon Field Emitter Array
Masayoshi NAGAO, Yutaka SACHO, Seigo KANEMARU, Takanobu SATO, Takashi MATSUKAWA, Junji ITOH,
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Abstract(in English) The HfC coated polycrystalline silicon (poly-Si) field emitter arrays (FEAs) were fabricated on an oxidized silicon wafer. The HfC coating layer was deposited by inductively coupled plasma assisted magnetron sputtering. The effect of the HfC thickness on the emission characteristics was investigated by depositing 15 nm and 30 nm thick HfC on the tip. The thinner HfC could effectively improve the emission characteristics of poly-Si FEA, while the thicker one degrades the emission. The methods of tip sharpening process were also investigated; one is thermal oxidation sharpening that is commonly used for the Si FEA fabrication, the other is Ar ion sputtering. The apex radius of the thermally oxidized FEA was much smaller than that of sputter sharpened one. However, some irregular shaped tips were found in the oxidized FEA that is responsible to gate current. The detailed fabrication and emission characteristics including gate current win be reported.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Vacuum nanoelectronics / Field emitter array / Field emission display / Poly-crystalline silicon / Hafnium carbide / surface modification
Paper # ED2003-180
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Committee ED
Conference Date 2003/12/5(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Hafnium Carbide Coated Poly-crystalline Silicon Field Emitter Array
Sub Title (in English)
Keyword(1) Vacuum nanoelectronics
Keyword(2) Field emitter array
Keyword(3) Field emission display
Keyword(4) Poly-crystalline silicon
Keyword(5) Hafnium carbide
Keyword(6) surface modification
1st Author's Name Masayoshi NAGAO
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology()
2nd Author's Name Yutaka SACHO
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology
3rd Author's Name Seigo KANEMARU
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology
4th Author's Name Takanobu SATO
4th Author's Affiliation Institute of Applied Physics University of Tsukuba
5th Author's Name Takashi MATSUKAWA
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology
6th Author's Name Junji ITOH
6th Author's Affiliation National Institute of Advanced Industrial Science and Technology
Date 2003/12/5
Paper # ED2003-180
Volume (vol) vol.103
Number (no) 497
Page pp.pp.-
#Pages 6
Date of Issue