Presentation 2003/5/9
Growth sequence dependence of threshold current density in GaInP/GaAs/GaInP laser diodes
Taketoshi YOSHIKANE, Atsushi KOIZUMI, Yasufumi FUJIWARA, Akira URAKAMI, Kentaro INOUE, Yoshikazu TAKEDA,
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Abstract(in English) It is well known that high-quality GaAs/GaInP interfaces are difficult to be grown by organometallic vapor phase epitaxy (OMVPE), because a lower-bandgap interlayer is formed because of the intermixing of P and As atoms at the heterointerfaces and/or In memory effect. 77K photoluminescence (PL) measurements revealed that a broad peak due to the interlayer, appearing at around 900 nm, originates from a GaAs-on-GaInP interface. The interlayer-related PL peak is suppressed completely by growing the GaAs-on-GaInP interface at temperatures 550℃ or below. By applying this sequence for GaInP/GaAs/GaInP laser diodes, threshold current density is lower and more uniform than that of the higher growth temperature diodes.
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Keyword(in English) photoluminescence / laser diode / GaAs / GaInP / heterointerface
Paper # ED2003-37
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Committee ED
Conference Date 2003/5/9(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Growth sequence dependence of threshold current density in GaInP/GaAs/GaInP laser diodes
Sub Title (in English)
Keyword(1) photoluminescence
Keyword(2) laser diode
Keyword(3) GaAs
Keyword(4) GaInP
Keyword(5) heterointerface
1st Author's Name Taketoshi YOSHIKANE
1st Author's Affiliation Department of Materials Science and Engineering, Graduate School of Engineering()
2nd Author's Name Atsushi KOIZUMI
2nd Author's Affiliation Department of Materials Science and Engineering, Graduate School of Engineering
3rd Author's Name Yasufumi FUJIWARA
3rd Author's Affiliation Department of Materials Science and Engineering, Graduate School of Engineering
4th Author's Name Akira URAKAMI
4th Author's Affiliation Department of Materials Science and Engineering, Graduate School of Engineering
5th Author's Name Kentaro INOUE
5th Author's Affiliation Department of Materials Science and Engineering, Graduate School of Engineering
6th Author's Name Yoshikazu TAKEDA
6th Author's Affiliation Department of Materials Science and Engineering, Graduate School of Engineering
Date 2003/5/9
Paper # ED2003-37
Volume (vol) vol.103
Number (no) 47
Page pp.pp.-
#Pages 6
Date of Issue