Presentation 2003/5/9
Structural Study on Vacuum Deposited CurnTe_2 Thin Films
Hiroshi IKEDA, Ryozo YOSHIDA, Takahiro TAKAHASHI, Yoshinori EMA,
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Abstract(in English) Chalcopyrite CuInTe_2 thin films have been formed by the deposition of its alloy chunks on Corning 1737 glass. Structural properties of the films were measured by X-ray diffraction, transmittance, etc, on the viewpoint of the substrate temperature and the annealing condition. The best condition to obtain chalcopyrite CuInTe_2 films without a secondary phase was as follows; deposition on the room temperature substrate and annealing at 300℃ 15min. Energy gap of the CuInTe_2 films was 0.93eV from the energy dependence of the absorption coefficient.
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Keyword(in English) CuInTe_2 / thin film / chalcopyrite-type / energy gap
Paper # ED2003-34
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Committee ED
Conference Date 2003/5/9(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Structural Study on Vacuum Deposited CurnTe_2 Thin Films
Sub Title (in English)
Keyword(1) CuInTe_2
Keyword(2) thin film
Keyword(3) chalcopyrite-type
Keyword(4) energy gap
1st Author's Name Hiroshi IKEDA
1st Author's Affiliation Department of Electrical and Electronic Engineering, Shizuoka University()
2nd Author's Name Ryozo YOSHIDA
2nd Author's Affiliation Department of Electrical and Electronic Engineering, Shizuoka University
3rd Author's Name Takahiro TAKAHASHI
3rd Author's Affiliation Department of Electrical and Electronic Engineering, Shizuoka University
4th Author's Name Yoshinori EMA
4th Author's Affiliation Department of Electrical and Electronic Engineering, Shizuoka University
Date 2003/5/9
Paper # ED2003-34
Volume (vol) vol.103
Number (no) 47
Page pp.pp.-
#Pages 5
Date of Issue