Presentation 2004/5/7
Fabrication of CdTe high energy radiation detector and imaging applications
Daisuke Sakashita, Yu Ishida, Toru Aoki, Yasuhiro Tomita, Yoshinori Hatanaka, Jiro Temmyo,
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Abstract(in English) We report on fabrication and performance of CdTe diode(M-π-n ,Size 0.8mm×2mm×0.5mm) for high energy radiation imaging device. Dicing CdTe wafer was added in fabrication process of CdTe diode. Result of dicing process, CdTe diodes showed lower leak current than before dicing. The surface exposed by dicing has an effect to reduce the leak current. For imaging applications, It was important that each CdTe detector shows uniformity property of energy spectrum. We cleared the relation between the leak current and FWHM of the 122keV peak of Co-57.The relation of CdTe diode showed the weak correlation property. We choose 512 uniformity CdTe diode detectors, and fabricated 512 pixels imaging device. Result of this fabrication, We obtain X-ray permeable image.
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Keyword(in English) CdTe / High energy radiation / imaging
Paper # ED2004-33,CPM2004-28,SDM2004-33
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Committee CPM
Conference Date 2004/5/7(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fabrication of CdTe high energy radiation detector and imaging applications
Sub Title (in English)
Keyword(1) CdTe
Keyword(2) High energy radiation
Keyword(3) imaging
1st Author's Name Daisuke Sakashita
1st Author's Affiliation Research Institute of Electronics, Shizuoka Univ()
2nd Author's Name Yu Ishida
2nd Author's Affiliation Research Institute of Electronics, Shizuoka Univ
3rd Author's Name Toru Aoki
3rd Author's Affiliation Research Institute of Electronics, Shizuoka Univ
4th Author's Name Yasuhiro Tomita
4th Author's Affiliation Hamamatsu Photonics
5th Author's Name Yoshinori Hatanaka
5th Author's Affiliation Aichi Univ. of Tech
6th Author's Name Jiro Temmyo
6th Author's Affiliation Research Institute of Electronics, Shizuoka Univ
Date 2004/5/7
Paper # ED2004-33,CPM2004-28,SDM2004-33
Volume (vol) vol.104
Number (no) 42
Page pp.pp.-
#Pages 6
Date of Issue