Presentation 2004/5/6
Conductivity control ofAlGaN using monomethylsilane
Shinya Itoh, Hiroki Tsuma, Akihiro Wakahara, Hiroshi Okada, Akira Yoshida,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Si doping for AlGaN was investigated using monomethylsilane : ((CH_3)SiH_3) as a source gas, and the Si-doping properties and the controllability of conductivity in Al_xGa_<1_x>N(x ≤ 0.6) were investigated. Si-doped Al_xGa_<1_x>N (x ≤ 0.6 ) layers were grown on AlN/ α-Al_2O_3 substrates by metalorganic vapor phase epitaxy at low-pressure (76 Torr). Al compositions were 0.24, 0.40 and 0.60. Full width at half maximum value of x-ray rocking curve from (0004) diffraction for AlGaN layers were 150~400 arcsec. The electron concentration at 300 K for Si-doped Al_xGa_<1-x>N with X = 0.24, 0.40 and 0.60 was proportional to the (CH_3)SiH_3 flow rate. The ionization energy increased slightly from 14 to 2 1 meV as increasing the Al composition from 0.24 to 0.60.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Monomethylsilane / Controllability of conductivity / Ionization energy / AlGaN / MOVPE
Paper # ED2004-19,CPM2004-14,SDM2004-19
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Committee CPM
Conference Date 2004/5/6(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Conductivity control ofAlGaN using monomethylsilane
Sub Title (in English)
Keyword(1) Monomethylsilane
Keyword(2) Controllability of conductivity
Keyword(3) Ionization energy
Keyword(4) AlGaN
Keyword(5) MOVPE
1st Author's Name Shinya Itoh
1st Author's Affiliation Toyohashi University of Techology()
2nd Author's Name Hiroki Tsuma
2nd Author's Affiliation Toyohashi University of Techology
3rd Author's Name Akihiro Wakahara
3rd Author's Affiliation Toyohashi University of Techology
4th Author's Name Hiroshi Okada
4th Author's Affiliation Toyohashi University of Techology
5th Author's Name Akira Yoshida
5th Author's Affiliation Toyohashi University of Techology
Date 2004/5/6
Paper # ED2004-19,CPM2004-14,SDM2004-19
Volume (vol) vol.104
Number (no) 41
Page pp.pp.-
#Pages 4
Date of Issue