| Presentation | 2004/9/3 Measurement of Thermophysical Properties of Very Thin Films and Thermal Analysis of Optical Recording Media : The Effect of Boundary Thermal Resistance on Phase Change Recording Media Tsukasa NAKAI, Keiichiro YUSU, Kenji TODORI, Shin-ichi TATSUTA, Sumio ASHIDA, Naoyuki TAKETOSHI, Tetsuya BABA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Thermal conductivities and boundary thermal resistances of thin films having the thickness of the order of ten nanometers were measured by using the thermo-reflectance method at room temperature. A thermal simulation of HD DVD-ARW (the next-generation advanced rewritable DVD) media was carried out to clarify the effect of boundary thermal resistance at the interface of those films. The thermal conductivity of thin films greatly depends on film thickness. The result of the thermal simulation depends significantly on whether the boundary thermal resistance is considered or not. Thus it is important to consider the boundary thermal resistances and using thermal properties of thin films to perform more accurate calculation for the phase change recording media. The results of the thermal simulation also suggested that the boundary thermal resistances dominate the thermal diffusion and response of the medium. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | boundary thermal resistance / thermal conductivity / thermal diffusivity / thermo-reflectance method / thermal design / HD DVD-ARW |
| Paper # | CPM2004-88 |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 2004/9/3(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Measurement of Thermophysical Properties of Very Thin Films and Thermal Analysis of Optical Recording Media : The Effect of Boundary Thermal Resistance on Phase Change Recording Media |
| Sub Title (in English) | |
| Keyword(1) | boundary thermal resistance |
| Keyword(2) | thermal conductivity |
| Keyword(3) | thermal diffusivity |
| Keyword(4) | thermo-reflectance method |
| Keyword(5) | thermal design |
| Keyword(6) | HD DVD-ARW |
| 1st Author's Name | Tsukasa NAKAI |
| 1st Author's Affiliation | Corporate Research and Development Center, Toshiba Corporation() |
| 2nd Author's Name | Keiichiro YUSU |
| 2nd Author's Affiliation | Core Technology Center, Digital Media Network Company, Toshiba Corporation |
| 3rd Author's Name | Kenji TODORI |
| 3rd Author's Affiliation | Corporate Research and Development Center, Toshiba Corporation |
| 4th Author's Name | Shin-ichi TATSUTA |
| 4th Author's Affiliation | Corporate Research and Development Center, Toshiba Corporation |
| 5th Author's Name | Sumio ASHIDA |
| 5th Author's Affiliation | Corporate Research and Development Center, Toshiba Corporation |
| 6th Author's Name | Naoyuki TAKETOSHI |
| 6th Author's Affiliation | National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST) |
| 7th Author's Name | Tetsuya BABA |
| 7th Author's Affiliation | National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST) |
| Date | 2004/9/3 |
| Paper # | CPM2004-88 |
| Volume (vol) | vol.104 |
| Number (no) | 287 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |