| Presentation | 2004/1/29 Development of In-Situ THB/HAST/TC Masashi NISHIMURA, Yoshikazu TAKAHASHI, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The In-situ THB/HAST/TC systems are developed for the LSI package evaluation. The HAST/THB system can monitor the power line leakage that enables the degradation during the stress. The In-situ TC system can monitor the resistance in the DUT up to 300 by the 4 point measurement. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | In-Situ / THB / HAST / TC / Package / Reliability |
| Paper # | CPM2003-175,ICD2003-214 |
| Date of Issue |
| Conference Information | |
| Committee | CPM |
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| Conference Date | 2004/1/29(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Development of In-Situ THB/HAST/TC |
| Sub Title (in English) | |
| Keyword(1) | In-Situ |
| Keyword(2) | THB |
| Keyword(3) | HAST |
| Keyword(4) | TC |
| Keyword(5) | Package |
| Keyword(6) | Reliability |
| 1st Author's Name | Masashi NISHIMURA |
| 1st Author's Affiliation | ITES Quality Assurance() |
| 2nd Author's Name | Yoshikazu TAKAHASHI |
| 2nd Author's Affiliation | Package Product Engineering, IBM Japan, Ltd. |
| Date | 2004/1/29 |
| Paper # | CPM2003-175,ICD2003-214 |
| Volume (vol) | vol.103 |
| Number (no) | 645 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |