| Presentation | 2004/1/29 Low cost DFT tester with IDDQ BOST Rocky Kobayashi, Shinji Kato, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | V500 DFT Focused Test System (Teseda Corp.) and QD-1010 IDDQ monitoring module (Q-Star Test nv) provides high accuracy, high speed, measurement method of IDDQ testing for SoC devices. This application is not needed any vector translations, specific control vectors and test program development. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | DFT / SCAN / BIST / BOST / IDDQ / DFT Tester |
| Paper # | CPM2003-172,ICD2003-211 |
| Date of Issue |
| Conference Information | |
| Committee | CPM |
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| Conference Date | 2004/1/29(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Low cost DFT tester with IDDQ BOST |
| Sub Title (in English) | |
| Keyword(1) | DFT |
| Keyword(2) | SCAN |
| Keyword(3) | BIST |
| Keyword(4) | BOST |
| Keyword(5) | IDDQ |
| Keyword(6) | DFT Tester |
| 1st Author's Name | Rocky Kobayashi |
| 1st Author's Affiliation | ATE Service Corporation() |
| 2nd Author's Name | Shinji Kato |
| 2nd Author's Affiliation | ATE Service Corporation |
| Date | 2004/1/29 |
| Paper # | CPM2003-172,ICD2003-211 |
| Volume (vol) | vol.103 |
| Number (no) | 645 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |