| Presentation | 2004/1/29 International Conference Report : Test Technology Trends in International Test Conference Kazumi Hatayama, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | ITC(International Test Conference) is the world largest international conference on test technology. Over 100 technical papers are presented for more than 1000 attendee every year. This paper outlines ITC2003 held in last October and overviews the test technology trends, especially in logic test area, from paper presentations in ITC2002. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | International Test Conference / Logic Test / Test Technology |
| Paper # | CPM2003-168,ICD2003-207 |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 2004/1/29(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | International Conference Report : Test Technology Trends in International Test Conference |
| Sub Title (in English) | |
| Keyword(1) | International Test Conference |
| Keyword(2) | Logic Test |
| Keyword(3) | Test Technology |
| 1st Author's Name | Kazumi Hatayama |
| 1st Author's Affiliation | EDA Tech. Development Dept., Renesas Technology Corp.() |
| Date | 2004/1/29 |
| Paper # | CPM2003-168,ICD2003-207 |
| Volume (vol) | vol.103 |
| Number (no) | 645 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |