| Presentation | 2004/1/29 Path delay fault diagnosis in combinational circuits under EB tester environment Yohei ZENDA, Koji NAKAMAE, Hiromu FUJIOKA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Path delay fault diagnosis algorithms for combinational circuits under EB tester environment have been proposed where the suspect circuit representation based on effect-cause diagnosis was utilized. The algorithms were applied to 8 kinds of ISCAS'85 benchmark circuits to evaluate the performance where the guided probe diagnosis was used as the reference method. A path delay fault from internal nodes to a primary output was set randomly in each benchmark circuit. Results show that the proposed algorithms improve the number of probed lines when the depth of fault (the number of lines on a faulty pass) was more than 10 lines. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | EB tester / delay fault diagnosis / suspect circuit / guided probe diagnosis |
| Paper # | CPM2003-167,ICD2003-206 |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 2004/1/29(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
| Secretary | |
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| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Path delay fault diagnosis in combinational circuits under EB tester environment |
| Sub Title (in English) | |
| Keyword(1) | EB tester |
| Keyword(2) | delay fault diagnosis |
| Keyword(3) | suspect circuit |
| Keyword(4) | guided probe diagnosis |
| 1st Author's Name | Yohei ZENDA |
| 1st Author's Affiliation | Department of Information Systems Engineering, Graduate School of Information Science and Technology, Osaka University() |
| 2nd Author's Name | Koji NAKAMAE |
| 2nd Author's Affiliation | Department of Information Systems Engineering, Graduate School of Information Science and Technology, Osaka University |
| 3rd Author's Name | Hiromu FUJIOKA |
| 3rd Author's Affiliation | Department of Information Systems Engineering, Graduate School of Information Science and Technology, Osaka University |
| Date | 2004/1/29 |
| Paper # | CPM2003-167,ICD2003-206 |
| Volume (vol) | vol.103 |
| Number (no) | 645 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |