Presentation 2003/5/8
AlGaN/GaN heterostructure MIS-HEMTs with Si_3N_4 gate insulator
Masaru Ochiai, Yutaka Ohno, Shigeru Kishimoto, Koichi Maezawa, Takashi Mizutani,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistors (MIS-HEMTs) using Si_3N_4 film as a gate insulator have been successfully fabricated. The gate leakage current decreased by about three orders of magnitude compared to that of the conventional AlGaN/GaN HEMTs without the Si_3N_4 gate insulator. The low-frequency noise of the MIS-HEMTs was smaller than that of the conventional HEMTs. Current collapse has also been suppressed in the MIS-HEMTs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) AlGaN / GaN HEMT / MIS-HEMTs / Si_3N_4 gate insulator / gate leakage current / low-frequency noise / current collapse
Paper # ED2003-23,CPM2003-22,SDM2003-23
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Committee CPM
Conference Date 2003/5/8(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) AlGaN/GaN heterostructure MIS-HEMTs with Si_3N_4 gate insulator
Sub Title (in English)
Keyword(1) AlGaN
Keyword(2) GaN HEMT
Keyword(3) MIS-HEMTs
Keyword(4) Si_3N_4 gate insulator
Keyword(5) gate leakage current
Keyword(6) low-frequency noise
Keyword(7) current collapse
1st Author's Name Masaru Ochiai
1st Author's Affiliation Department of Quantum Engineering, Nagoya University()
2nd Author's Name Yutaka Ohno
2nd Author's Affiliation Department of Quantum Engineering, Nagoya University
3rd Author's Name Shigeru Kishimoto
3rd Author's Affiliation Department of Quantum Engineering, Nagoya University
4th Author's Name Koichi Maezawa
4th Author's Affiliation Department of Quantum Engineering, Nagoya University
5th Author's Name Takashi Mizutani
5th Author's Affiliation Department of Quantum Engineering, Nagoya University
Date 2003/5/8
Paper # ED2003-23,CPM2003-22,SDM2003-23
Volume (vol) vol.103
Number (no) 48
Page pp.pp.-
#Pages 4
Date of Issue