Presentation 2003/4/18
Microfocus X-ray CT analysis method and Its application for high-density LSI packaging
Akira HIRAKIMOTO, Tadahiro SHIOTA, Taketo KISHI, Masami , Masami EDAHIRO, Masayuki KAMEGAWA, Masaaki UKITA,
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Abstract(in English) In the semiconductor related industries, micro focus x-ray computed tomographic systems are now being recognized as powerful quality control tools. Especially, the importance of three-dimensional non-destructive data is essential and indispensable to the technology progress of high-density LSI packaging. The latest systems with high resolution and high throughput will be shown in this paper.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Microfocus X-ray / X-ray Computed Tomography / High-density LSI / Three-dimensional non-destructive data / Inspection Technology
Paper # RS2003-11,CPM2003-11,OPE2003-11
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Committee CPM
Conference Date 2003/4/18(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Microfocus X-ray CT analysis method and Its application for high-density LSI packaging
Sub Title (in English)
Keyword(1) Microfocus X-ray
Keyword(2) X-ray Computed Tomography
Keyword(3) High-density LSI
Keyword(4) Three-dimensional non-destructive data
Keyword(5) Inspection Technology
1st Author's Name Akira HIRAKIMOTO
1st Author's Affiliation NDI Business Unit, Shimadzu Corp.()
2nd Author's Name Tadahiro SHIOTA
2nd Author's Affiliation NDI Business Unit, Shimadzu Corp.
3rd Author's Name Taketo KISHI
3rd Author's Affiliation NDI Business Unit, Shimadzu Corp.
4th Author's Name Masami
4th Author's Affiliation NDI Business Unit, Shimadzu Corp.
5th Author's Name Masami EDAHIRO
5th Author's Affiliation NDI Business Unit, Shimadzu Corp.
6th Author's Name Masayuki KAMEGAWA
6th Author's Affiliation NDI Business Unit, Shimadzu Corp.
7th Author's Name Masaaki UKITA
7th Author's Affiliation Technology Research Laboratory, Shimadzu Corp.
Date 2003/4/18
Paper # RS2003-11,CPM2003-11,OPE2003-11
Volume (vol) vol.103
Number (no) 34
Page pp.pp.-
#Pages 4
Date of Issue