Presentation 2003/7/25
Structural and electrical properties of Ta_2O_5 thin films formed by metalorganic decomposition
Hiroaki SAITO, Masahiro MIZUKAMI, Hisashi FUKUDA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) In this study, tantalum oxide (Ta_2O_5) - Tetraethoxysilane (TEOS: (Si(OC_2H_5)_4) composite thin films were formed on silicon (Si) by metalorganic decomposition (MOD) for obtaining high performance Ta_O_5 thin film. The results of structural evaluation showed that crystallization proceeds gradually with increasing annealing temperature, while crystallization decrease with increasing TEOS ratio. The electric characteristics showed that the decrease of dielectric constant and leakage current occurs gradually with increasing of TEOS ratio. Fairly good dielectric properties are obtained for the 0.88Ta_2O_5-0.12TEOS film annealed at 900℃.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) MOSFET / gate dielectric / metalorganic decomposition / Ta_2O_5 / TEOS
Paper # CPM2003-68
Date of Issue

Conference Information
Committee CPM
Conference Date 2003/7/25(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Structural and electrical properties of Ta_2O_5 thin films formed by metalorganic decomposition
Sub Title (in English)
Keyword(1) MOSFET
Keyword(2) gate dielectric
Keyword(3) metalorganic decomposition
Keyword(4) Ta_2O_5
Keyword(5) TEOS
1st Author's Name Hiroaki SAITO
1st Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Muroran Institute of Technology()
2nd Author's Name Masahiro MIZUKAMI
2nd Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Muroran Institute of Technology
3rd Author's Name Hisashi FUKUDA
3rd Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Muroran Institute of Technology
Date 2003/7/25
Paper # CPM2003-68
Volume (vol) vol.103
Number (no) 245
Page pp.pp.-
#Pages 6
Date of Issue