Presentation 2003/2/21
Deep-UV Near Field Exposure for Optical Disk Mastering
Shingo Imanishi,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Near-field mastering process was realized with a 266 nm laser and a solid immersion lens (SIL) of 1.35 numerical aperture (NA). For an objective, one of molded aspherical lenses with a wave front error (WFE) of below 70 mλrms was assembled with a supersphere SIL of about 25 mλrms WFE. The distance between the SIL and the glassmaster, or the air gap, was detected with using a 532 nm laser and it was servo-controlled at about 100 nm by driving the objective with an air-suspended pad and a PZT actuator. A residual fluctuation of the air gap was constrained within 10 nmPP. As a result of read only memory (ROM) recording in a density corresponding to 40 gigabytes (GB) in compact disc (CD) size, a clear pit pattern was fabricated. As for 25 GB ROM recording, acceptable signal quality was obtained.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Near-Field / Mastering / Exposure with a 266 nm Laser / Gap Detection with a 532 nm Laser / Detection by Total Internal Reflection / Air-suspended Pad / PZT Actuator
Paper # CPM2002-170
Date of Issue

Conference Information
Committee CPM
Conference Date 2003/2/21(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Deep-UV Near Field Exposure for Optical Disk Mastering
Sub Title (in English)
Keyword(1) Near-Field
Keyword(2) Mastering
Keyword(3) Exposure with a 266 nm Laser
Keyword(4) Gap Detection with a 532 nm Laser
Keyword(5) Detection by Total Internal Reflection
Keyword(6) Air-suspended Pad
Keyword(7) PZT Actuator
1st Author's Name Shingo Imanishi
1st Author's Affiliation Optical Disk Development Division,AV/IT Development Group,SONY Corporation()
Date 2003/2/21
Paper # CPM2002-170
Volume (vol) vol.102
Number (no) 664
Page pp.pp.-
#Pages 5
Date of Issue