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Presentation 2002/11/6
Evaluation of Si c(4×4) structure formed using MMSi, DMSi
Masayuki HARASHIMA, Yuzuru NARITA, Kanji YASUI, Tadashi AKAHANE,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Growth of cubic-silicon carbide (3C-SiC) on Si(001)-2×1 surface was investigated using organosilicon compounds such as monomethylsilane (MMSi) and dimethylsilane (DMSi). From in-situ observation of the initial stage of SiC growth by reflection high-energy electron diffraction (RHEED), it was found that Si c(4×4) structure was formed before the nucleation of SiC islands. Using X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM), Si c(4×4) structure surface and the surface after SiC nucleation were measured. Si c(4×4) structure was found to be formed by Si_1-xCx alloy layer, and the layer thickness was estimated to be 0.3 nm. SiC islands appeared along <010> direction of Si substrate reflecting the periodicity of Si c(4×4) structure.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Silicon carbide / monomrthylsilan / dimethylsilane / Si c(4×4) structure / RHEED / XPS / AFM
Paper # CPM2002-125
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Committee CPM
Conference Date 2002/11/6(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of Si c(4×4) structure formed using MMSi, DMSi
Sub Title (in English)
Keyword(1) Silicon carbide
Keyword(2) monomrthylsilan
Keyword(3) dimethylsilane
Keyword(4) Si c(4×4) structure
Keyword(5) RHEED
Keyword(6) XPS
Keyword(7) AFM
1st Author's Name Masayuki HARASHIMA
1st Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology()
2nd Author's Name Yuzuru NARITA
2nd Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
3rd Author's Name Kanji YASUI
3rd Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
4th Author's Name Tadashi AKAHANE
4th Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
Date 2002/11/6
Paper # CPM2002-125
Volume (vol) vol.102
Number (no) 434
Page pp.pp.-
#Pages 6
Date of Issue