| Presentation | 2003/10/10 Low-frequency noise properties of NbN, Nb and Bi-2212-based tunnel junctions H. Ishida, A. Saito, K. Okanoue, A. Kawakami, Z. Wang, A. Irie, G. Oya, K. Hamasaki, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | 1/f noise properties in Nb, NbN-based tunnel junctions and Bi-2212 intrinsic tunnel junctions have been investigated. We found that Nb and NbN-based junctions exhibit η(1/f noise parameter) vs. A(E) (Andreev reflection probability) curve scales approximately as log η &vprop: aA(E)^<-1> / exp(bA(E)^<-1> -1). We also observed excess 1/fnoise in sub-gap voltage region for all type junctions. We suggest that the excess 1/fnoise arises from the Andreev reflection phenomena. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Nb, NbN tunnel junction / Bi-2212 intrinsic junction / 1/f noise / Andreev reflection |
| Paper # | SCE2003-21 |
| Date of Issue |
| Conference Information | |
| Committee | SCE |
|---|---|
| Conference Date | 2003/10/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Low-frequency noise properties of NbN, Nb and Bi-2212-based tunnel junctions |
| Sub Title (in English) | |
| Keyword(1) | Nb, NbN tunnel junction |
| Keyword(2) | Bi-2212 intrinsic junction |
| Keyword(3) | 1/f noise |
| Keyword(4) | Andreev reflection |
| 1st Author's Name | H. Ishida |
| 1st Author's Affiliation | Department of Engineering, Nagaoka University of Technology() |
| 2nd Author's Name | A. Saito |
| 2nd Author's Affiliation | Department of Engineering, Yamagata University |
| 3rd Author's Name | K. Okanoue |
| 3rd Author's Affiliation | Department of Engineering, Nagaoka University of Technology |
| 4th Author's Name | A. Kawakami |
| 4th Author's Affiliation | KARC Communications Research Laboratory |
| 5th Author's Name | Z. Wang |
| 5th Author's Affiliation | KARC Communications Research Laboratory |
| 6th Author's Name | A. Irie |
| 6th Author's Affiliation | Department of Engineering, Utsunomiya University |
| 7th Author's Name | G. Oya |
| 7th Author's Affiliation | Department of Engineering, Utsunomiya University |
| 8th Author's Name | K. Hamasaki |
| 8th Author's Affiliation | Department of Engineering, Nagaoka University of Technology |
| Date | 2003/10/10 |
| Paper # | SCE2003-21 |
| Volume (vol) | vol.103 |
| Number (no) | 367 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |