Presentation 2003/7/11
Critical Current Density and 22GHz Surface Resistance of YBCO Liquid Phase Epitaxy Fillm
K. Suzuki, K. Nomura, Y. Enomoto, T. Izumi, I. Hirabayashi,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Critical current densities (Jc) of YB_2C_3O_<7-σ> (YBCO) films grown on MgO(100) substrates by liquid phase epitaxy (LPE) were examined. A feature of this report is that the Jc characteristic evaluation only of the surface region away from the substrate was carried out. Generally and until now, the Jc of a thin film has got large critical current density than the case of the bulk. It was considered that the cause was the some pinning effects by the substrate. Only one-micron depth of surface side region was annealed in the oxygen. Then the Jc, X-ray diffractio (XDR) and 22GHz microwave surface resistance (Rs) of the film were measured. The results showed that the Jc of the YBCO LPE film was a large value of 10^6A/cm^2 at 77K.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) HTS / YBCO / liquid phase epitaxy / microwave surface resistance / critical current density
Paper # SCE2003-18
Date of Issue

Conference Information
Committee SCE
Conference Date 2003/7/11(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Critical Current Density and 22GHz Surface Resistance of YBCO Liquid Phase Epitaxy Fillm
Sub Title (in English)
Keyword(1) HTS
Keyword(2) YBCO
Keyword(3) liquid phase epitaxy
Keyword(4) microwave surface resistance
Keyword(5) critical current density
1st Author's Name K. Suzuki
1st Author's Affiliation Superconductivity Research Laboratory, ISTEC()
2nd Author's Name K. Nomura
2nd Author's Affiliation Hitachi Cable, Ltd.
3rd Author's Name Y. Enomoto
3rd Author's Affiliation NTT Advanced Technology Corporation
4th Author's Name T. Izumi
4th Author's Affiliation Superconductivity Research Laboratory, ISTEC
5th Author's Name I. Hirabayashi
5th Author's Affiliation Superconductivity Research Laboratory, ISTEC
Date 2003/7/11
Paper # SCE2003-18
Volume (vol) vol.103
Number (no) 211
Page pp.pp.-
#Pages 5
Date of Issue