Presentation 2003/4/16
Measurement of dielectric constant of R-,A-,C-plane sapphire substrates and fabrication of YBCO thin films on these substrates.
Masanobu SHIRAKAWAI, Shinobu WATANABE, Keiji AIZAWA, Masanobu KUSUNOKI, Masashi MUKAIDA, Shigetoshi OHSHIMA,
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Abstract(in English) Sapphire substrates are expected as suitable substrates of superconducting microwave devices, however, there are few reports on anisotropic dielectric constant of the sapphire substrates. Therefore, we examine the temperature dependence of dielectric constant. This paper presents the measured results of dielectric constants of r-, a-, and c-plane sapphire substrates by the cavity resonance method. Also, we have examined the conditions of epitaxial CeO_2 films on these sapphire substrates, and also examined epitaxial growth of YBa_2Cu_3O_7-δ films were grown on these CeO_2 buffer layers.
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Keyword(in English) Cavity resonance method / Dielectric constant / Sapphire substrates / YBCO films
Paper # SCE2003-1,MW2003-1
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Committee SCE
Conference Date 2003/4/16(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement of dielectric constant of R-,A-,C-plane sapphire substrates and fabrication of YBCO thin films on these substrates.
Sub Title (in English)
Keyword(1) Cavity resonance method
Keyword(2) Dielectric constant
Keyword(3) Sapphire substrates
Keyword(4) YBCO films
1st Author's Name Masanobu SHIRAKAWAI
1st Author's Affiliation Faculty of Engineering,Yamagata University()
2nd Author's Name Shinobu WATANABE
2nd Author's Affiliation /
3rd Author's Name Keiji AIZAWA
3rd Author's Affiliation / /
4th Author's Name Masanobu KUSUNOKI
4th Author's Affiliation
5th Author's Name Masashi MUKAIDA
5th Author's Affiliation
6th Author's Name Shigetoshi OHSHIMA
6th Author's Affiliation
Date 2003/4/16
Paper # SCE2003-1,MW2003-1
Volume (vol) vol.103
Number (no) 20
Page pp.pp.-
#Pages 7
Date of Issue