| Presentation | 2003/1/22 SQUID gates using all YBaCuO trilayer junctions Tsutomu NAKAJIMA, Hiroshi SATO, Eiji FUJIMOTO, Kohji HOHKAWA, Hiroshi AKOH, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We report a demonstration of high-temperature superconducting (HTS) superconducting quantum interface devices (SQUID) gates using all YBa_2Cu_3O_<7-d> (YBaCuO) trilayer junctions. Two-junction SQUID gates, which were basic gates of the SFQ logic gates, were fabricated to study basic characteristics. The devices consist of all c-axis oriented YBaCuO/PrBaCuO/YBaCuO trilayer junctions, epitaxial CeO_2 insulator layers, and YBaCuO wiring layers. The fabricated gates exhibited the clear threshold characteristics at temperatures ranging from 4.2 K to 70 K. The estimated sheet inductance was in good agreement with a design value. This indicates that the SQUID gate can be used as a circuit element at below 70 K. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | All YBaCuO trilayer junctions / SQUID gate / Threshold characteristic / Inductance |
| Paper # | SCE2002-37 |
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| Conference Information | |
| Committee | SCE |
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| Conference Date | 2003/1/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | SQUID gates using all YBaCuO trilayer junctions |
| Sub Title (in English) | |
| Keyword(1) | All YBaCuO trilayer junctions |
| Keyword(2) | SQUID gate |
| Keyword(3) | Threshold characteristic |
| Keyword(4) | Inductance |
| 1st Author's Name | Tsutomu NAKAJIMA |
| 1st Author's Affiliation | Kanagawa Institute of Technology() |
| 2nd Author's Name | Hiroshi SATO |
| 2nd Author's Affiliation | Correlated Electron Research Center(CERC),National Institute of Advanced Industrial Science and Technology(AIST) |
| 3rd Author's Name | Eiji FUJIMOTO |
| 3rd Author's Affiliation | Correlated Electron Research Center(CERC),National Institute of Advanced Industrial Science and Technology(AIST) |
| 4th Author's Name | Kohji HOHKAWA |
| 4th Author's Affiliation | Kanagawa Institute of Technology |
| 5th Author's Name | Hiroshi AKOH |
| 5th Author's Affiliation | Correlated Electron Research Center(CERC),National Institute of Advanced Industrial Science and Technology(AIST) |
| Date | 2003/1/22 |
| Paper # | SCE2002-37 |
| Volume (vol) | vol.102 |
| Number (no) | 612 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |